Experimental Analysis of C-V and I-V Curves Hysteresis in SiC MOSFETs
نویسندگان
چکیده
SiC MOSFETs have already replace silicon-based device in power applications, even if some technological issues are still not solved. The most important of them is related to the complex traps distribution at SiC/SiO 2 interface. Interface affect overall behavior, modifying channel mobility and introducing hysteresis. In this work experimental C-V I-V curves carried out on various commercial MOSFET different temperatures. focus comparison hysteresis arising trench planar MOSFETs.
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ژورنال
عنوان ژورنال: Materials Science Forum
سال: 2022
ISSN: ['1422-6375', '0250-9776', '0255-5476', '1662-9752', '1662-9760']
DOI: https://doi.org/10.4028/p-bzki64